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Modeling electromigration-induced stress evolution and drift kinetics with a stress-dependent diffusivity

Bibliographic reference Chizhik, S.A. ; Proost, Joris ; Matvienko, A.A. ; Sidelnikov, A.A.. Modeling electromigration-induced stress evolution and drift kinetics with a stress-dependent diffusivity. In: Journal of Applied Physics, Vol. 88, no. 6, p. 3301 (2000)
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