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In-situ monitoring of the internal stress evolution during thin film anodising

Bibliographic reference Proost, Joris ; Vanhumbeeck, J.-F. ; Van Overmeere, Quentin. In-situ monitoring of the internal stress evolution during thin film anodising. In: Electrochemical Society. Transactions, Vol. 11, no. 24, p. 35-42 (2008)
Permanent URL http://hdl.handle.net/2078.1/70660