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Measurements for bipolar devices

Bibliographic reference Jespers, P.G.A.. Measurements for bipolar devices.Proceedings of the NATO Advanced Study Institute on Process and Device Modelling for Integrated Circuit Design (Louvain-la-Neuve, Belgium, 19-29 July 1977). In: van de Wiele, F.; Engl, W.L.; Jespers, P.G.;, Proceedings of the NATO Advanced Study Institute on Process and DeviceModelling for Integrated Circuit Design, Noordhoff1977, p. 307-363
Permanent URL http://hdl.handle.net/2078.1/68494