User menu

Analysis of nonuniformly doped SOI MOSFETs

Bibliographic reference Paelinck, P. ; Vancauwenberghe, O. ; Van de Wiele, F.. Analysis of nonuniformly doped SOI MOSFETs.Solid State Devices. Proceedings of the 17th European Solid State Device Research Conference, ESSDERC '87 (Bologna, Italy, 14-17 September 1987). In: Soncini, G.; Calzolari, P.U.;, Solid State Devices. Proceedings of the 17th European Solid StateDevice Research Conference, ESSDERC '87, North-holland1988, p. 557-560
Permanent URL http://hdl.handle.net/2078.1/68337