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Characterization of SOI MOSFETs by gate capacitance measurements

Bibliographic reference Flandre, Denis ; Gentinne, Bernard. Characterization of SOI MOSFETs by gate capacitance measurements.IEEE International Conference on Microelectronic Test Structures (ICMTS 1993) (Sitges (Spain), du 22/03/1993 au 25/03/1993). In: Proceedings of the 1993 International Conference on Microelectronic Test Structures (ICMTS 93) (Cat. No.93CH3220-1), IEEE1993, p.283-287
Permanent URL http://hdl.handle.net/2078.1/68253