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Charge injection characterization of thin-film SOI MOS transistors at high temperature

Bibliographic reference Picun, G. ; Demeus, L. ; Flandre, Denis. Charge injection characterization of thin-film SOI MOS transistors at high temperature.Silicon-On-Insulator Technology and Devices X. Proceedings of the Tenth International Symposium (Washington, DC (USA), du 25/03/2001 au 29/03/2001). In: Cristoloveanu, S.; Hemment, P.L.F.; Izumi, K.T.; Celler, G.K.; Assaderaghi, F.; Kim, Y-W;, Silicon-on-Insulator Technology and Devices X. Proceedings of the TenthInternational Symposium (Electrochemical Society Proceedings Vol.2001-3), Electrochem. soc2001, p.115-120
Permanent URL http://hdl.handle.net/2078.1/68093