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Self-consistent simulation of nano scale SOI devices: the case of nano flash memory

Bibliographic reference Xiaohui Tang ; Baie, X. ; Colinge, J.P. ; Van De Wiele, F. ; Bayot, Vincent. Self-consistent simulation of nano scale SOI devices: the case of nano flash memory.Silicon-On-Insulator Technology and Devices X. Proceedings of the Tenth International Symposium (Washington, DC, USA, 25-29 March 2001). In: Cristoloveanu, S.; Hemment, P.L.F.; Izumi, K.T.; Celler, G.K.; Assaderaghi, F.; Kim, Y-W;, Silicon-on-Insulator Technology and Devices X. Proceedings of the TenthInternational Symposium (Electrochemical Society Proceedings Vol.2001-3), Electrochem. soc2001, p. 409-414
Permanent URL http://hdl.handle.net/2078.1/68088