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DNA electrical detection based on inductor resonance frequency in standard CMOS technology

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Laurent, G. [UCL] Moreno Hagelsieb, Luis [UCL] Lederer, Dimitri [UCL] Lobert, P.E. [UCL] Flandre, Denis [UCL] Remacle, Jean-François [UCL] Raskin, Jean-Pierre [UCL]

Several electrical methods have been studied for the detection of DNA hybridization on silicon chips, using capacitance or resistance changes of micro-arrays of electrode fingers. In this work, we studied the possibility of detecting DNA by the measurement of the resonance frequency shift of an inductor designed on Si substrate. Self-resonance frequency shift as large as 10 GHz before and after DNA hybridization has been measured for inductors made from standard CMOS process. with a protective oxide coating and a DNA amplification based on silver enhancement.

Document type Communication à un colloque (Conference Paper) – Présentation orale avec comité de sélection
Publication date 2003
Language Anglais
Conference "29th European Solid-State Device Research (ESSDERC 2003)", )Estoril (Portugal (du 16/09/2003 au 18/09/2003)
Peer reviewed yes
Host document Franca, J.; Freitas, P. ; "Proceedings of the 29th European Solid-State Device Research (ESSDERC '03)"- 171-174 (ISBN : 0-7803-7999-3)
Publisher IEEE
Publication status Publié
Affiliations UCL - FSA/ELEC - Département d'électricité
UCL - FSA/AUCE - Département d'architecture, d'urbanisme et de génie civil environnemental
Keywords CMOS technology ; Frequency measurement ; Inductors ; Resonance ; Resonant frequency ; Electrical resistance measurement ; Electric resistance ; DNA ; Silicon ; Capacitance
Links
Bibliographic reference Laurent, G. ; Moreno Hagelsieb, Luis ; Lederer, Dimitri ; Lobert, P.E. ; Flandre, Denis ; et. al. DNA electrical detection based on inductor resonance frequency in standard CMOS technology.29th European Solid-State Device Research (ESSDERC 2003) ()Estoril (Portugal, du 16/09/2003 au 18/09/2003). In: Franca, J.; Freitas, P., Proceedings of the 29th European Solid-State Device Research (ESSDERC '03), IEEE2003, p.171-174
Permanent URL http://hdl.handle.net/2078.1/68037