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Frequency degradation of SOI MOS device output conductance

Bibliographic reference Lederer, Dimitri ; Dehan, Morin ; Vanhoenacker-Janvier, Danielle ; Flandre, Denis ; Raskin, Jean-Pierre. Frequency degradation of SOI MOS device output conductance.2003 IEEE International SOI Conference. Proceedings (Newport Beach, CA (USA), du 29/09/2003 au 02/10/2003). In: 2003 IEEE International SOI Conference. Proceedings (Cat. No.03CH37443), IEEE2003, p.76-77
Permanent URL http://hdl.handle.net/2078.1/68031