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Elastic modulus of nanomaterials: resonant contact-AFM measurement and reduced-size effects (invited paper)

Bibliographic reference Nysten, Bernard ; Fretigny, C. ; Cuenot, S.. Elastic modulus of nanomaterials: resonant contact-AFM measurement and reduced-size effects (invited paper).Testing, Reliability, and Application of Micro- and Nano-Materials Systems III (San Diego, CA, USA, 10 March 2005). In: SPIE - the International Society for Optical Engineering. Proceedings, Spie-int. soc. opt. eng2005, p.Vol. 5766, p. 78-88
Permanent URL http://hdl.handle.net/2078.1/67956