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Wideband characterization of body-accessed PD SOI MOSFETs with multiport measurements

Bibliographic reference Lederer, Dimitri ; Rozeau, O. ; Raskin, Jean-Pierre. Wideband characterization of body-accessed PD SOI MOSFETs with multiport measurements.2005 IEEE International SOI Conference (Honolulu, HI, USA, 3-6 October 2005). In: 2005 IEEE International SOI Conference (QSIC 2005) (IEEE Cat. No.05CH37694), IEEE2005, p. 65-66
Permanent URL http://hdl.handle.net/2078.1/67946