User menu

New de-embedding technique based on Cold-FET measurement

Bibliographic reference Pailloncy, G. ; Raskin, Jean-Pierre. New de-embedding technique based on Cold-FET measurement.1st European Microwave Integrated Circuits Conference (Manchester, UK, 10-13 September 2006). In: 1st European Microwave Integrated Circuits Conference (IEEE Cat.No.06EX1410), IEEE2006, p.4 pp.
Permanent URL http://hdl.handle.net/2078.1/67895