User menu

Characterization of body node in PD SOI MOSFETs using 4-port VNA measurements

Bibliographic reference Lederer, Dimitri ; Raskin, Jean-Pierre. Characterization of body node in PD SOI MOSFETs using 4-port VNA measurements.2007 Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems (Long Beach, CA, USA, 10-12 January 2007). In: 2007 Topical Meeting on Silicon Monolithic Integrated Circuits in RFSystems (IEEE Cat No. 07EX1459C), IEEE2006, p.4 pp.
Permanent URL http://hdl.handle.net/2078.1/67892