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Wide-band simulation and characterization of digital substrate noise in SOI technology

Bibliographic reference Bol, David ; Ambroise, Renaud ; Roda Neve, Cesar ; Raskin, Jean-Pierre ; Flandre, Denis. Wide-band simulation and characterization of digital substrate noise in SOI technology.2007 IEEE International SOI Conference (Indian Wells, CA, USA, 1-4 October 2007). In: Proccedings 2007 IEEE International SOI Conference, IEEE2007, p.133-134
Permanent URL http://hdl.handle.net/2078.1/67841