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Impact of layout style and parasitic capacitances in full adder

Bibliographic reference Kamel, Dina ; Bol, David ; Flandre, Denis. Impact of layout style and parasitic capacitances in full adder.2008 IEEE International SOI Conference (New Paltz, NY, USA, 6-9 October 2008). In: Proceedings of the 2008 IEEE International SOI Conference, IEEE2008, p.97-98
Permanent URL http://hdl.handle.net/2078.1/67715