User menu

A chemical memory snapshot

Bibliographic reference Schmidt, J.-M.. A chemical memory snapshot.Smart Card Research and Advanced Applications. 8th IFIP WG 8.8/11.2 International Conference, CARDIS 2008 (London, UK, 8-11 September 2008). In: Grimaud, G.; Standaert, F.-X.;, Smart Card Research and Advanced Applications. 8th IFIP WG 8.8/11.2 International Conference, CARDIS 2008, Springer-verlag2008, p. 283-289
Permanent URL
  1. Mangard, S., Oswald, E., Popp, T.: Power Analysis Attacks – Revealing the Secrets of Smart Cards. Springer, Heidelberg (2007)
  2. Kocher Paul C., Timing Attacks on Implementations of Diffie-Hellman, RSA, DSS, and Other Systems, Advances in Cryptology — CRYPTO ’96 (1996) ISBN:9783540615125 p.104-113, 10.1007/3-540-68697-5_9
  3. Biham Eli, Shamir Adi, Differential fault analysis of secret key cryptosystems, Advances in Cryptology — CRYPTO '97 (1997) ISBN:9783540633846 p.513-525, 10.1007/bfb0052259
  4. Boneh Dan, DeMillo Richard A., Lipton Richard J., On the Importance of Checking Cryptographic Protocols for Faults, Advances in Cryptology — EUROCRYPT ’97 (1997) ISBN:9783540629757 p.37-51, 10.1007/3-540-69053-0_4
  5. Anderson, R.J., Kuhn, M.G.: Tamper Resistance - a Cautionary Note. In: Second Usenix Workshop on Electronic Commerce, pp. 1–11 (November 1996)
  6. Kömmerling, O., Kuhn, M.G.: Design Principles for Tamper-Resistant Smartcard Processors. In: USENIX Workshop on Smartcard Technology (Smartcard 1999), pp. 9–20 (May 1999)
  7. Samyde, D., Skorobogatov, S.P., Anderson, R.J., Quisquater, J.J.: On a New Way to Read Data from Memory. In: IEEE Security in Storage Workshop (SISW 2002), pp. 65–69. IEEE Computer Society, Los Alamitos (2002)
  8. Skorobogatov, S.: Low temperature data remanence in static RAM. Technical report, University of Cambridge Computer Laboratory (June 2002)
  9. Skorobogatov, S.P.: Semi-invasive attacks - A new approach to hardware security analysis. PhD thesis, University of Cambridge - Computer Laboratory (2005),
  10. Gärtner, H., Hoffmann, M., Schaschke, H., Schürmann, I.M.: Das große Buch der Chemie. Compact Verlag (2004)
  11. Beck, F.: Integrated Circuit Failure Analysis: A Guide to Preparation Techniques. Wiley, Chichester (1998)