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Characterization of ytterbium silicide formed in ultra high vacuum

Bibliographic reference Laszcz, A. ; Ratajczak, J. ; Czerwinski, A. ; Katcki, J. ; Srot, V. ; et. al. Characterization of ytterbium silicide formed in ultra high vacuum.16th International Conference on Microscopy of Semiconducting Materials (Oxford, UK, 17-20 March 2009). In: 16th International Conference on Microscopy of Semiconducting Materials, Iop publishing ltd.2010, p.Vol. 209, 012056 (4 pp.)
Permanent URL http://hdl.handle.net/2078.1/67422