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Modeling of main leakage currents and their contribution to channel current in Fin-FETs

Bibliographic reference Garduno, I. ; Cerdeira, A. ; Estrada, M. ; Kilchytska, Valeriya ; Flandre, Denis. Modeling of main leakage currents and their contribution to channel current in Fin-FETs.2010 27th International Conference on Microelectronics (MIEL 2010) (Nis, Serbia, 16-19 May 2010). In: Proceedings of the 27th International Conference on Microelectronics (MIEL 2010), IEEE2010, p.99-102
Permanent URL http://hdl.handle.net/2078.1/67396