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Interferometric Sensitivity with Fourier Based Deflectometry

Bibliographic reference Beghuin, D. ; Dubois, X. ; Joannes, L. ; Hutsebaut, X. ; Antoine, Philippe. Interferometric Sensitivity with Fourier Based Deflectometry.International Conference on Advanced Phase Measurement Methods in Optics and Imaging (Monte Verita, AS, USA, 16-21 May 2010). In: International Conference on Advanced Phase Measurement Methods in Optics and Imaging, American institute of physics2010, p.Vol. 1236, p. 248-253
Permanent URL http://hdl.handle.net/2078.1/67389