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Use of XPS to detect variations in dispersion of impregnated and ion-exchanged NiO/SiO/sub 2/ systems

Bibliographic reference Houalla, M. ; Delmon, Bernard. Use of XPS to detect variations in dispersion of impregnated and ion-exchanged NiO/SiO/sub 2/ systems. In: Surface and Interface Analysis, Vol. 3, no. 3, p. 103-105 (1981)
Permanent URL http://hdl.handle.net/2078.1/66497
  1. Defosse, J. Catal., 51, 269 (1978)
  2. and Proceedings of the 6th International Congress on Catalysis, edited by and Vol. 2, p. 611. The Chemical Society, London (1976).
  3. Fung, J. Catal., 58, 454 (1979)
  4. Kerkhof, J. Phys. Chem., 83, 1612 (1979)
  5. Briggs, J. Electron Spectrosc. Relat. Phenom., 9, 487 (1976)
  6. Houalla, J. Chem. Soc. Faraday Trans. 1, 76, 2128 (1980)
  7. Delannay, Surf. Interface Anal., 1, 172 (1979)
  8. Helmer, Appl. Phys. Lett., 13, 266 (1968)
  9. Castle, J. Electron Spectrosc. Relat. Phenom., 19, 409 (1980)
  10. Scofield, J. Electron Spectrosc. Relat. Phenom., 8, 129 (1976)
  11. Penn, J. Electron Spectrosc. Relat. Phenom., 9, 29 (1976)
  12. Chang, Surf. Sci., 48, 9 (1975)
  13. Klasson, J. Electron Spectrosc. Relat. Phenom., 3, 427 (1974)
  14. Reilman, J. Electron Spectrosc. Relat. Phenom., 8, 389 (1976)