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The dispersion of nickel oxide supported on boron-modified silicas, as determined by TEM and XPS measurements

Bibliographic reference Houalla, M. ; Delannay, Francis ; Delmon, Bernard. The dispersion of nickel oxide supported on boron-modified silicas, as determined by TEM and XPS measurements. In: Journal of Electron Spectroscopy and Related Phenomena, Vol. 25, no. 1, p. 59-65 (1982)
Permanent URL http://hdl.handle.net/2078.1/66485