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Atomic force microscopy investigation of buckling patterns of nickel thin films on polycarbonate substrates

Bibliographic reference Cleymand, F. ; Coupeau, C. ; Grilhe, J.. Atomic force microscopy investigation of buckling patterns of nickel thin films on polycarbonate substrates. In: Philosophical Magazine Letters : structure and properties of condensed matter, Vol. 82, no. 9, p. 477-482 (2002)
Permanent URL http://hdl.handle.net/2078.1/66233
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