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Comparison of harmonic distortion characterization techniques for SOI MOSFETs

Bibliographic reference Parvais, Bertrand ; Torrese, G. ; Cerderia, A. ; Schreurs, D. ; Raskin, Jean-Pierre. Comparison of harmonic distortion characterization techniques for SOI MOSFETs. In: Acta Technica Belgica. Revue H F: Electricite Courants Faibles. Electronique Telecommunications, no. 4, p. 43-55 (2002)
Permanent URL http://hdl.handle.net/2078.1/66224