User menu

16-term Error Model and Calibration Procedure for On-wafer Network Analysis Measurements

Bibliographic reference Butler, JV. ; Rytting, DK. ; Iskander, MF. ; Pollard, RD. ; Vandenbossche, Margot. 16-term Error Model and Calibration Procedure for On-wafer Network Analysis Measurements.INTERNATIONAL MICROWAVE SYMP (BOSTON(Ma), Jun 10-14, 1991). In: IEEE Transactions on Microwave Theory and Techniques, Vol. 39, no. 12, p. 2211-2217 (1991)
Permanent URL http://hdl.handle.net/2078.1/63609