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Improvement of crystalline quality of 3-inch InP wafers

Bibliographic reference Gondet, S ; Duffar, T ; Jacob, G ; Van den Bogaert, N. ; Louchet, F. Improvement of crystalline quality of 3-inch InP wafers.International Conference on Indium Phosphide and Related Materials (UNIV TSUKUBA, UNIV HALL TSUKUBA, IBARAKI (Japan), May 11-15, 1998). In: Japanese Journal of Applied Physics. Part 2, Letters & Express Lettres, Vol. 38, no. 2B, p. 972-976 (1999)
Permanent URL http://hdl.handle.net/2078.1/62331