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Thermal stress simulation and interface destabilisation in indium phosphide grown by LEC process

Bibliographic reference Gondet, S ; Duffar, T ; Jacob, G ; Van den Bogaert, N. ; Louchet, F. Thermal stress simulation and interface destabilisation in indium phosphide grown by LEC process.12th International Conference on Crystal Growth, held in Conjunction with the 10th International Conference on Vapor Growth and Epitaxy (ICCG-12/ICVGE-10) (JERUSALEM(Israel), Jul 26-31, 1998). In: Journal of Crystal Growth, Vol. 199, p. 129-134 (1999)
Permanent URL http://hdl.handle.net/2078.1/62329