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Probing the organization of adsorbed protein layers: Complementarity of atomic force microscopy, X-ray photoelectron spectroscopy and radiolabeling

Bibliographic reference Dufrêne, Yves ; Marchal, T.G. ; Rouxhet, Paul. Probing the organization of adsorbed protein layers: Complementarity of atomic force microscopy, X-ray photoelectron spectroscopy and radiolabeling. In: Applied Surface Science, Vol. 144-145, p. 638-643 (1999)
Permanent URL http://hdl.handle.net/2078.1/62321