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Carbon black surface characterization by TOF-SIMS and XPS

Bibliographic reference Bertrand, Patrick ; Weng, LT.. Carbon black surface characterization by TOF-SIMS and XPS. In: Rubber Chemistry and Technology, Vol. 72, no. 2, p. 384-397 (1999)
Permanent URL http://hdl.handle.net/2078.1/62245