User menu

ToF-SIMS and XPS study of sulphur on carbon black surface

Bibliographic reference Poleunis, Claude ; Vanden Eynde, X ; Grivei, E. ; Smet, H ; Probst, N. ; et. al. ToF-SIMS and XPS study of sulphur on carbon black surface. In: Surface and Interface Analysis, Vol. 30, no. 1, p. 420-424 (2000)
Permanent URL http://hdl.handle.net/2078.1/62110
  1. In Carbon Black (2nd edn revised and expanded). (eds). Marcel Dekker: New York, 1993; 175-220.
  2. Bertrand P., Weng L. T., Carbon Black Surface Characterization by TOF-SIMS and XPS, 10.5254/1.3538809
  3. Briggs D, Hearn MJ, Interaction of ion beams with polymers, with particular reference to SIMS, 10.1016/0042-207x(86)90156-9
  4. Weng L. T., Vereecke G., Genet M. J., Rouxhet P. G., Stone-Masui J. H., Bertrand P., Stone W. E. E., Quantitative XPS. Part II: Comparison between different quantitative approaches for two different spectrometers?determination of the contamination-reduced thickness, application of the determined transmission functions and accuracy achieved, 10.1002/sia.740200303
  5. Vanden Eynde X., Bertrand P., Quantification of polystyrene blend surfaces based on end group ToF-SIMS analysis, 10.1016/s0169-4332(98)00626-6