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ToF-SIMS and XPS study of sulphur on carbon black surface

Bibliographic reference Poleunis, Claude ; Vanden Eynde, X ; Grivei, E. ; Smet, H ; Probst, N. ; et. al. ToF-SIMS and XPS study of sulphur on carbon black surface. In: Surface and Interface Analysis, Vol. 30, no. 1, p. 420-424 (2000)
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