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Measurement of the thermomechanical strain of electronic devices by shearography

Bibliographic reference Dilhaire, S. ; Jorez, S. ; Cornet, Alain ; Lopez, LDP ; Claeys, W.. Measurement of the thermomechanical strain of electronic devices by shearography.11th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2000) (DRESDEN(Germany), Oct 02-06, 2000). In: Microelectronics Reliability, Vol. 40, no. 8-10, p. 1509-1514 (2000)
Permanent URL http://hdl.handle.net/2078.1/62100