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Total-dose effects in double-gate-controlled NPN bipolar transistors

Bibliographic reference Vandooren, A ; Yuan, J ; Flandre, Denis ; Colinge, Jean-Pierre. Total-dose effects in double-gate-controlled NPN bipolar transistors.European Conference on Radiation and its Effects on Components and Systems (RADECS) (LOUVAIN LA NEUVE (Belgium), du 11/09/2000 au 13/09/2000). In: Proceedings de RADECS 2001, IEEE-inst Electrical Electronics Engineers Inc : New York2001
Permanent URL http://hdl.handle.net/2078.1/61877