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Influence of device geometry on SOI single-hole transistor characteristics

Bibliographic reference Tang, Xiaohui ; Baie, X. ; Colinge, JP. ; Loumaye, Pierre ; Renaux, Christian ; et. al. Influence of device geometry on SOI single-hole transistor characteristics.EOS/ESD Symposium (ANAHEIM(California), du 26/09/2000 au 28/09/2000). In: Microelectronics Reliability, Vol. 41, no. 11, p. 1841-1846 (2001)
Permanent URL http://hdl.handle.net/2078.1/61863