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Cesium/xenon dual beam depth profiling with TOF-SIMS: measurement and modeling of M+, MCs+, and (MCS2)-C-2 (+) yields

Bibliographic reference Brison, J ; Conard, T. ; Vandervorst, Wilfried ; Houssiau, L.. Cesium/xenon dual beam depth profiling with TOF-SIMS: measurement and modeling of M+, MCs+, and (MCS2)-C-2 (+) yields.14th International Conference on Secondary Ion Mass Spectrometry (SIMS 14) (San Diego(Ca), Sep 14-19, 2003). In: Applied Surface Science, Vol. 231-2, p. 749-753 (2004)
Permanent URL http://hdl.handle.net/2078.1/61404