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ToF-SIMS molecular characterization and nano-SIMS imaging of submicron domain formation at the surface of PS/PMMA blend and copolymer thin films

Bibliographic reference Kailas, Lekshmi ; Audinot, JN ; Migeon, HN ; Bertrand, Patrick. ToF-SIMS molecular characterization and nano-SIMS imaging of submicron domain formation at the surface of PS/PMMA blend and copolymer thin films. In: Applied Surface Science, Vol. 231-2, p. 289-295 (2004)
Permanent URL http://hdl.handle.net/2078.1/61272