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A new memory effect (MSD) in fully depleted SOI MOSFETs

Bibliographic reference Bawedin, Maryline ; Cristoloveanu, Sorin ; Yun, JG ; Flandre, Denis. A new memory effect (MSD) in fully depleted SOI MOSFETs. In: Solid-State Electronics, Vol. 49, no. 9, p. 1547-1555 (2005)
Permanent URL http://hdl.handle.net/2078.1/60847