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Joint Studies By X-ray Photoelectron-spectroscopy and Analytical Electron-microscopy of the Dispersion of Nickel-oxide Supported On Silica and Silica-aluminas

Bibliographic reference Houalla, M. ; Delannay, Francis ; Delmon, Bernard. Joint Studies By X-ray Photoelectron-spectroscopy and Analytical Electron-microscopy of the Dispersion of Nickel-oxide Supported On Silica and Silica-aluminas. In: Journal of the Chemical Society. Faraday Transactions I, Vol. 76, p. 1766-& (1980)
Permanent URL http://hdl.handle.net/2078.1/60290