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Analytical Electron-microscopy of Heterogeneous Catalysts

Bibliographic reference Delannay, Francis. Analytical Electron-microscopy of Heterogeneous Catalysts. In: Catalysis Reviews: Science and Engineering, Vol. 22, no. 1, p. 141-170 (1980)
Permanent URL http://hdl.handle.net/2078.1/60283
  1. Fornwalt D. E., Micron, 4, 99 (1973)
  2. Freeman L. A., Howie A., Treacy M. M. J., Bright field and hollow cone dark field electron microscopy of palladium catalysts, 10.1111/j.1365-2818.1977.tb00057.x
  3. Delannay F., J. Chem. Soc., Faraday Trans. 1
  4. MEHTA S, Catalytic synthesis of methanol from CO/H2II. Electron microscopy (TEM, STEM, microdiffraction, and energy dispersive analysis) of the Cu/ZnO and Cu/ZnO/Cr2O3 catalysts, 10.1016/0021-9517(79)90001-0
  5. Harnsberger H. F., Course on “Experimental Techniques in Catalytic Research,” (1969)
  6. Purdy, G. R. and Anderson, R. B. 1976.Experimental Methods in Catalytic Research, Edited by: Anderson, R. B. and Dawson, D. T. Vol. 2, 95New York: Academic.
  7. Colliex, C. and Trebbia, P. Proceedings of the 9th International Congress on Electron Microscopy. 1978, Toronto. Edited by: Sturgess, J. M. pp.268Toronto: Microscopical Society of Canada.
  8. Fejes, P. L., ed. 1978. Cornell University Materials Research Center. Report No. 3082
  9. Introduction to Analytical Electron Microscopy, ISBN:9781475755831, 10.1007/978-1-4757-5581-7
  10. Chandler J. A., X-ray Microanalysis in the Electron Microscope (1977)
  11. Lorimer, G. W. and Cliff, G. 1976.Electron Microscopy in Mineralogy, Edited by: Wenk, H. R. 506Berlin: Springer.
  12. Jacobs M. H., Industrial applications of analytical electron microscopy, 10.1111/j.1365-2818.1973.tb04669.x
  13. Boswell P. G., J. Aust. Inst. Metals, 24, 156 (1976)
  14. Beaman, D. R. 1978.Environmental Pollutants, Edited by: Toribara, T. Y., Coleman, J. R., Dahneke, B. E. and Feldman, I. 255New York: Plenum.
  15. Castaing R. (1951)
  16. Marshall A. T., Micron, 8, 135 (1977)
  17. Faulkner R. G., Norgård K., X-ray microanalytical senstivity and spatial resolution in scanning transmission electron microscopes, 10.1002/xrs.1300070403
  18. Cliff G., Lorimer G. W., The quantitative analysis of thin specimens, 10.1111/j.1365-2818.1975.tb03895.x
  19. Goldstein, J. I., Costley, J. L., Lorimer, G. W. and Reed, S. J. B. 1977.Scanning Electron Microscopy, Vol. 1, 315IITRI. SEM 1977
  20. Joy, D. C. and Maher, D. M. 1977.Scanning Electron Microscopy, Vol. 1, 325IITRI. SEM 1977
  21. Morgan A. J., Davies T. W., Erasmus D. A., Analysis of droplets from iso-atomic solutions as a means of calibrating a transmission electron analytical microscope (TEAM), 10.1111/j.1365-2818.1975.tb04025.x
  22. Sprys, J. W. and Short, M. A. 1976. Paper 9
  23. Heinrich, K. F. J. 1966.The Electron Microprobe, Edited by: McKinley, T. D., Heinrich, K. F. J. and Wittry, D. B. 296New York: Wiley.
  24. Lorimer, G. W., Cliff, G. and Clark, J. N. 1976.Developments in Electron Microscopy and Analysis, Edited by: Venables, J. A. 153London: Academic. EMAG 75
  25. Joy, D. C. and Maher, D. M. Proceedings of the 33rd Annual EMSA Meeting. Edited by: Bailey, G. W. pp.242Baton Rouge, Louisiana: Claitor.
  26. Kelly P. M., Jostsons A., Blake R. G., Napier J. G., The determination of foil thickness by scanning transmission electron microscopy, 10.1002/pssa.2210310251
  27. Philibert, J. and Tixier, R. 1975.Physical Aspects of Electron Microscopy and Microbeam Analysis, Edited by: Siege, B. M. and Beaman, D. R. 333New York: Wiley.
  28. Kyser, D. F. and Geiss, R. H. Proceedings of the Microbeam Analysis Society, 12th Annual Conference. Paper 110
  29. Hutchings R., Loretto M.H., Jones I.P., Smallman R.E., Spatial resolution in x-ray microanalysis of thin foils in stem, 10.1016/s0304-3991(78)80062-x
  30. Woldseth R., X-ray Energy Spectrometry (1973)
  31. Lycourghiotis A., J. Chem. Soc., Faraday Trans. 1
  32. Houalla M., J. Chem. Soc., Faraday Trans.
  33. SPRYS J, A comparison of techniques for the examination of catalyst particles in the transmission electron microscope, 10.1016/0021-9517(75)90285-7
  34. Delannay F., Thakur D.S., Delmon B., Tem, sem and electron microprobe study of unsupported Co, Fe or Ni Promoted, MoS2 Hydrotreating catalysts, 10.1016/0022-5088(79)90249-2
  35. Lineweaver Jack L., Oxygen Outgassing Caused by Electron Bombardment of Glass, 10.1063/1.1702680
  36. Houalla, M., Delannay, F. and Delmon, B. To Be Published
  37. FLYNN P, The limitation of the transmission electron microscope for characterization of supported metal catalysts, 10.1016/0021-9517(74)90267-x
  38. Hirsch P. B., Electron Microscopy of Thin Crystals (1965)
  39. Delannay F., J. Microsc. Spectrosc, Electron., 3, 411 (1978)
  40. Delannay F., Houalla M., Pirotte D., Delmon B., Critical assessment by analytical electron microscopy of the significance of XPS measurements of the dispersion of supported catalysts, 10.1002/sia.740010507
  41. Houalla M., J. Chem. Soc., Faraday Trans, 1
  42. Houalla M., J. Phys. Chem.
  43. GAJARDO P, Structure of oxide CoMo/$gamma;-Al203 hydrodesulfurization catalysts: An XPS and DRS study, 10.1016/0021-9517(80)90073-1
  44. Apecetche, M. A. and Delannay, F. Unpublished Data
  45. Lycourghiotis A., J. Chem. Soc., Faraday Trans. 1