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Surface characterization of organic materials by ToF-SIMS: How to improve the sensitivity

Bibliographic reference Bertrand, Patrick ; Delcorte, Arnaud. Surface characterization of organic materials by ToF-SIMS: How to improve the sensitivity. In: American Chemical Society. Abstracts of Papers (at the National Meeting), Vol. 231 (2006)
Permanent URL http://hdl.handle.net/2078.1/59955