User menu

Characterization of FD SOI devices and VCO's on thin dielectric membranes under pressure

Bibliographic reference Olbrechts, Benoit ; Flandre, Denis ; Rue, Bertrand ; Suski, J. ; Raskin, Jean-Pierre. Characterization of FD SOI devices and VCO's on thin dielectric membranes under pressure.3rd Workshop of the Thematic-Network-on-Silicon-on-Insulator-Technology-Devices-and-Circuits (EUROSOI 07) (Leuven (Belgium), Jan 24-26, 2007). In: Solid-State Electronics, Vol. 51, no. 9, p. 1229-1237 (2007)In: Proceedings of the 3rd Workshop of the Thematic-Network-on-Silicon-on-Insulator-Technology-Devices-and-Circuits (EUROSOI 07), Pergamon-elsevier Science Ltd : Oxford2007
Permanent URL http://hdl.handle.net/2078.1/59526