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Dynamic prediction of point defects in Czochralski silicon growth. An attempt to reconcile experimental defect diffusion coefficients with the V/G criterion

Bibliographic reference Van Goethem, N. ; de Potter, A. ; Van den Bogaert, N. ; Dupret, François. Dynamic prediction of point defects in Czochralski silicon growth. An attempt to reconcile experimental defect diffusion coefficients with the V/G criterion.2nd International Symposium on Point Defects and Nonstoichiometry (Sendai(Japan), Oct, 2005). In: Journal of Physics and Chemistry of Solids, Vol. 69, no. 2-3, p. 320-324 (2008)
Permanent URL http://hdl.handle.net/2078.1/59315