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MIMC reliability and electrical behavior defined by a physical layer property of the dielectric

Bibliographic reference Ackaert, J. ; Charavel, Rémy ; Dhondt, K. ; Vlachakis, B. ; De Schepper, L. ; et. al. MIMC reliability and electrical behavior defined by a physical layer property of the dielectric.19th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (Maastricht(Netherlands), Sep 29-oct 02, 2008). In: Microelectronics Reliability, Vol. 48, no. 8-9, p. 1553-1556 (2008)
Permanent URL http://hdl.handle.net/2078.1/59144