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Depth profiling of polymer samples using Ga+ and C-60(+) ion beams

Bibliographic reference Nieuwjaer, Nicolas ; Poleunis, Claude ; Delcorte, Arnaud ; Bertrand, Patrick. Depth profiling of polymer samples using Ga+ and C-60(+) ion beams. In: Surface and Interface Analysis, Vol. 41, no. 1, p. 6-10 (2009)
Permanent URL http://hdl.handle.net/2078.1/59052
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