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Compact model for single event transients and total dose effects at high temperatures for partially depleted SOI MOSFETs

Bibliographic reference Alvarado, Joaquin ; Flandre, Denis ; Boufouss, El Hafed ; Kilchytska, Valeriya. Compact model for single event transients and total dose effects at high temperatures for partially depleted SOI MOSFETs. In: Microelectronics Reliability, Vol. 50, no. 9-11, p. 1852-1856 (2010)
Permanent URL http://hdl.handle.net/2078.1/58793