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Transmission electron microscopy study of erbium silicide formation from Ti/Er stack for Schottky contact applications

Bibliographic reference Ratajczak, J. ; Laszcz, A. ; Czerwinski, A. ; Katcki, J. ; Phillipp, F. ; et. al. Transmission electron microscopy study of erbium silicide formation from Ti/Er stack for Schottky contact applications.13th International Conference on Electron Microscopy (Zakopane(Poland), Jun 08-11, 2008). In: Journal of Microscopy, Vol. 237, no. 3, p. 379-383 (2010)
Permanent URL http://hdl.handle.net/2078.1/58635
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