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Experimental study of transconductance and mobility behaviors in ultra-thin SOI MOSFETs with standard and thin buried oxides

Bibliographic reference Rudenko, T. ; Flandre, Denis ; Kilchytska, Valeriya ; Burignat, S. ; Raskin, Jean-Pierre ; et. al. Experimental study of transconductance and mobility behaviors in ultra-thin SOI MOSFETs with standard and thin buried oxides.5th Workshop of the Thematic-Network-on-Silicon-on-Insulator-Technology-Devices-and-Circuits (EUROSOI 2009) (Chalmers Univ Technol, Gothenburg (Sweden), Jan 19-21, 2009). In: Solid-State Electronics, Vol. 54, no. 2, p. 164-170 (2010)In: Proceedings of the 5th Workshop of the Thematic-Network-on-Silicon-on-Insulator-Technology-Devices-and-Circuits (EUROSOI 2009), Pergamon : (United Kingdom) Kidlington2010
Permanent URL http://hdl.handle.net/2078.1/58617