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Current Lines and Accurate Contact Current Evaluation in 2-d Numerical-simulation of Semiconductor-devices

Bibliographic reference Palm, E. ; Vandewiele, F.. Current Lines and Accurate Contact Current Evaluation in 2-d Numerical-simulation of Semiconductor-devices. In: IEEE Transactions on Electron Devices, Vol. 32, no. 10, p. 2052-2059 (1985)
Permanent URL http://hdl.handle.net/2078.1/54940