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Xps Determination of the Thickness of Adsorbed Mouthrinse Components On Dental Enamel

Bibliographic reference Busscher, HJ. ; Vandermei, HC. ; Genet, MJ. ; Perdok, JF. ; Rouxhet, Paul. Xps Determination of the Thickness of Adsorbed Mouthrinse Components On Dental Enamel. In: Surface and Interface Analysis, Vol. 15, no. 5, p. 344-346 (1990)
Permanent URL http://hdl.handle.net/2078.1/51792
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