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Measurement of Intrinsic Gate Capacitances of Soi Mosfets

Bibliographic reference Flandre, Denis ; Vandewiele, F. ; Jespers, PGA. ; Haond, M.. Measurement of Intrinsic Gate Capacitances of Soi Mosfets. In: IEEE Electron Device Letters, Vol. 11, no. 7, p. 291-293 (1990)
Permanent URL http://hdl.handle.net/2078.1/51730