User menu

Interpretation of Quasi-static C-v Characteristics of Mosos Capacitors On Soi Substrates

Bibliographic reference Flandre, Denis ; Loo, T. ; Verlinden, P. ; Vandewiele, F.. Interpretation of Quasi-static C-v Characteristics of Mosos Capacitors On Soi Substrates. In: Electronics Letters, Vol. 27, no. 1, p. 43-44 (1991)
Permanent URL http://hdl.handle.net/2078.1/51277