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Temperature-programmed Reduction and X-ray Photoelectron-spectroscopy of Copper-oxide On Alumina Following Exposure To Sulfur-dioxide and Oxygen

Bibliographic reference Kartheuser, B. ; Hodnett, BK. ; Riva, A. ; Centi, G. ; Matralis, H. ; et. al. Temperature-programmed Reduction and X-ray Photoelectron-spectroscopy of Copper-oxide On Alumina Following Exposure To Sulfur-dioxide and Oxygen. In: Industrial & Engineering Chemistry Research, Vol. 30, no. 9, p. 2105-2113 (1991)
Permanent URL http://hdl.handle.net/2078.1/50944